使用UV-VIS光谱仪对CR-39探测器的α暴露的估计
H Alameri1, Y Abou-Ali1, M H Obeid2
1Department of Physics, Faculty of Science, University of Damascus, P.O. Box 30621, Damascus, Syria.
概括
通过UV-VIS光谱光度测量,可以通过测量光学特性有效地估计CR-39探测器对α粒子的暴露. 更高的探测器蚀刻时间提高了这种非侵入性α粒子检测方法的准确性.
科学领域:
- 核物理和剂量计核物理和剂量计
- 材料科学和光谱学 材料科学和光谱学
背景情况:
- CR-39塑料探测器广泛用于α粒子检测.
- 估计阿尔法颗粒暴露的传统方法涉及微观轨道计数,这可能是耗时的.
- 材料的光学特性可能对辐射引起的损伤敏感.
研究的目的:
- 调查使用UV-VIS光谱光度计作为估计CR-39探测器对α粒子暴露的非侵入性方法的可行性.
- 为了将UV-VIS光谱数据与α粒子轨迹密度相关联.
- 评估探测器蚀刻时间对光谱光度法有效性的影响.
主要方法:
- CR-39探测器暴露于来自Americium-241 (Am-241) 和气源的α粒子.
- 使用传统光学显微镜量化了α粒子轨迹密度.
- 暴露的CR-39探测器的传输光谱使用UV-VIS光谱 (400-1000纳米范围) 进行测量.
主要成果:
- 在CR-39探测器上的UV-VIS光谱仪读数 (透射率) 和α粒子轨迹密度之间建立了相关性.
- 光谱光度法在估计阿尔法粒子暴露方面表现出有效性.
- 增加了探测器蚀刻时间,从而提高了通过UV-VIS光谱学估计α粒子暴露的效率.
结论:
- 紫外线-VIS光谱光度测量为使用CR-39探测器估计α粒子暴露提供了一个可行的,非侵入性的替代方案.
- 该方法的灵敏度受到探测器处理参数的影响,特别是蚀刻时间.
- 这种技术具有快速高效的α粒子剂量测量潜力.
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