Biasing of Metal-Semiconductor Junctions
Diode: Forward bias
Biasing of FET
Diode: Reverse bias
MOSFET: Depletion Mode
Biasing of P-N Junction
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Tao Long1, Jun Zhao1, Bo Xiong1
1School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China.
设计了一种新型位置敏感的线性绕漂移探测器 (LWSDD),采用双阳极和S形阴极,以提高性能. 这种设计提高了有效的面积和收集效率,用于粒子检测.
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