Rui Dong1, Hongliang Lu1, Caozhen Yang1

  • 1Key Laboratory for Wide Band Gap Semiconductor Materials and Devices of Education Ministry, School of Microelectronics, Xidian University, Xi'an 710071, China.

Micromachines
|April 27, 2024
PubMed
概括

集成电路由于尺寸缩小,容易受到粒子辐射的影响. 这项研究引入了一种新方法,可以准确预测由负载共享效应引起的软误差,从而提高电路可靠性.