用约瑟夫森显微镜探测微波振荡器的近场探测
Ping Zhang1, Jingjing Lv1, Shoucheng Hou1
1School of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China.
Nano letters
|April 29, 2024
概括
超导约瑟夫森探针显微镜揭示了电压控制振荡器中的干扰源和最佳状态. 这种非破坏性技术提高了集成电路设计和高频应用的性能.
科学领域:
- 电气工程 电气工程
- 材料科学 材料科学 材料科学
- 物理 物理学 物理
背景情况:
- 电压控制振荡器 (VCO) 是高频集成电路 (IC) 中的关键组件,对于相锁循环,时钟发生器和频率合成器至关重要.
- 对于VCO的现有表征方法往往缺乏分辨率,以识别复杂IC中微妙的性能降低现象.
研究的目的:
- 实施超导约瑟夫森探针显微镜,用于近场微波检测多个VCO.
- 识别干扰源,了解VCO中不稳定的操作状态.
- 通过微波分布分析,确定VCO的最佳工作条件.
主要方法:
- 利用超导约瑟夫森探针显微镜进行高分辨率近场微波检测.
- 在各种操作条件下在多个VCO上执行频谱跟踪.
- 分析微波分布以确定最佳工作状态和干扰源.
主要成果:
- 观察到的现象如流浪光谱和频率漂移在不稳定的运行状态.
- 识别了来自电源线路和频率分隔器的寄生式电磁场,作为单位间干扰的来源.
- 通过分析微波场分布来描述最佳工作状态.
结论:
- 超导约瑟夫森探针显微镜是一种重要的非破坏性工具,用于表征集成毫米波芯片.
- 这些发现为优化VCO电路设计和提高性能提供了关键的见解.
- 了解近场微波相互作用是提高高频IC的可靠性和效率的关键.
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