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Updated: Jun 27, 2025

Using a Cyclic Ion Mobility Spectrometer for Tandem Ion Mobility Experiments
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一种新的双层线性离子陷质量分析仪的概念和模拟,用于微电子机械系统质谱测量

Yupeng Cheng1,2, Youjiang Liu2, Zhangxu Wu1,2

  • 1University of Science and Technology of China, Hefei, China.

European journal of mass spectrometry (Chichester, England)
|May 6, 2024
PubMed
概括

本研究介绍了一种用于微电子机械系统 (MEMS) 质谱的双层线性离子陷质量分析仪 (dLIT). 这种新型的MEMS设备表现出高精度和出色的性能,即使在高压下也是如此.

关键词:
交流频率扫描的交流频率扫描.在高压性能方面,高压性能非常好.离子轨迹模拟的模拟多极扩张的多极扩张.稳定性图表 稳定性图表

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