相关实验视频

Updated: May 5, 2026

Probing and Mapping Electrode Surfaces in Solid Oxide Fuel Cells
15:08

Probing and Mapping Electrode Surfaces in Solid Oxide Fuel Cells

Published on: September 20, 2012

16.0K

集成硫剂与多异质接口Fe7S8/NiS@C复合材料用于宽带微波吸收

Yikun Chen1, Yan Wang1, Chenchen Li2

  • 1School of Materials and Chemical Engineering, Institute of Science and Technology for New Energy, Xi'an Technological University, Xi'an, 710021, China.

Small (Weinheim an der Bergstrasse, Germany)
|May 7, 2024
PubMed
概括

这项研究开发了一种合硫复合物 (Fe7S8/NiS@C),涂上了NiFe层的双氧化物 (LDHs),以提高微波吸收 (MA). 该材料实现了卓越的性能,证明了其作为高效MA材料的潜力.

关键词:
电磁波的吸收电磁波的吸收异构接口是异构接口.有层的双氧化.硫兴奋剂使用硫.

更多相关视频

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics13:58

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on: September 28, 2016

11.8K
Synthesis and Characterization of Fe-doped Aluminosilicate Nanotubes with Enhanced Electron Conductive Properties09:34

Synthesis and Characterization of Fe-doped Aluminosilicate Nanotubes with Enhanced Electron Conductive Properties

Published on: November 15, 2016

9.2K

相关概念视频

Biasing of Metal-Semiconductor Junctions01:27

Biasing of Metal-Semiconductor Junctions

Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
919