Jove
Visualize
联系我们
JoVE
x logofacebook logolinkedin logoyoutube logo
关于 JoVE
概览领导团队博客JoVE 帮助中心
作者
出版流程编辑委员会范围与政策同行评审常见问题投稿
图书馆员
用户评价订阅访问资源图书馆顾问委员会常见问题
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experiments存档
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教师资源中心教师网站
使用条款与条件
隐私政策
政策

相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.2K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.2K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

10.2K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
10.2K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

9.0K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
9.0K

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序
Same author

A superconducting transition edge sensor array for synchrotron soft x-ray emission spectroscopies of low-dimensional and impurity-level concentration systems.

The Review of scientific instruments·2026
Same author

Epigenetic and oncogenic inhibitors converge to drive a metabolic catastrophe in castration-resistant prostate cancer.

The Journal of clinical investigation·2026
Same author

Development of Silicon Micromachined Waveguide Filter-Banks for On-Chip Spectrometers.

IEEE transactions on applied superconductivity : a publication of the IEEE Superconductivity Committee·2026
Same author

A Multicenter Retrospective Outcomes Analysis of Patients with Localized Synovial Sarcoma.

Cancer research communications·2026
Same author

Using a 4-Megapixel Hybrid Photon Counting Detector for Fast, Laboratory-Based Nanoscale X-Ray Tomography.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same author

Primary activity measurement of an Am-241 solution using microgram inkjet gravimetry and decay energy spectrometry.

Metrologia·2026
Same journal

RETRACTED: Zhang et al. A Novel Framework for Reconstruction and Imaging of Target Scattering Centers via Wide-Angle Incidence in Radar Networks. <i>Sensors</i> 2025, <i>25</i>, 6802.

Sensors (Basel, Switzerland)·2026
Same journal

Enhancing Unsupervised Multi-Source Domain Adaptation for Person Re-Identification via Mixture of Experts and Graph-Based Relation.

Sensors (Basel, Switzerland)·2026
Same journal

Development of an Instrumented Glove for Palmar Pressure Assessment in Kayakers.

Sensors (Basel, Switzerland)·2026
Same journal

Development and Experimental Validation of an Autonomous IoT-Based Monitoring System for Real-Time Water Quality Assessment in the Amazon River.

Sensors (Basel, Switzerland)·2026
Same journal

Semi-Supervised Adversarial Learning Framework for Controller Area Network Bus Intrusion Detection.

Sensors (Basel, Switzerland)·2026
Same journal

Smart Optimization Method for Safety Signs in Innovative Manufacturing Environments Integrating Industrial Field IoT Sensors and Knowledge Graphs.

Sensors (Basel, Switzerland)·2026
查看所有相关文章

相关实验视频

Updated: Jun 26, 2025

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy
10:29

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

Published on: February 5, 2017

12.7K

纳米三维成像集成电路使用扫描电子显微镜和过渡边缘传感器光谱仪.

Nathan Nakamura1,2, Paul Szypryt1,2, Amber L Dagel3

  • 1National Institute of Standards and Technology, Boulder, CO 80305, USA.

Sensors (Basel, Switzerland)
|May 11, 2024
PubMed
概括
此摘要是机器生成的。

一个新的实验室规模的X射线纳米图谱仪器使用扫描电子显微镜和超导探测器来实现纳米级成像. 这种紧的系统克服了大型同步仪器在材料表征方面的局限性.

关键词:
在X射线成像中使用X射线成像.在X射线纳米图形学.计算机断层扫描 (CT) 是一种计算机断层扫描.集成电路的集成电路.

更多相关视频

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

10.1K
Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
10:00

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

11.8K

相关实验视频

Last Updated: Jun 26, 2025

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy
10:29

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

Published on: February 5, 2017

12.7K
Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

10.1K
Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
10:00

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

11.8K

科学领域:

  • 材料科学 材料科学 材料科学
  • 纳米技术纳米技术
  • 在X射线物理中,X射线物理

背景情况:

  • 对于纳米级材料的表征,X射线纳米图非常重要.
  • 目前的方法受到X射线流量和斑点大小的限制,需要大型同步发射器设施.
  • 需要紧的,高分辨率的实验室规模纳米图谱.

研究的目的:

  • 为了展示一个新的实验室规模的X射线纳米图形仪器.
  • 为了实现纳米尺度的空间分辨率在同步机设施之外.
  • 为了克服传统X射线断层扫描的局限性.

主要方法:

  • 扫描电子显微镜 (SEM) 电子束与超导过渡边缘传感器 (TES) 微热量计相结合.
  • 在样品附近的金属目标上生成一个聚焦的X射线点.
  • 利用能量分辨率的X射线检测来实现高的信号噪声比.

主要成果:

  • 在一个紧的足迹中展示了纳米级,特定元素的X射线成像.
  • 在3DCu-SiO2集成电路中成功成像了160nm的特征.
  • 通过基于实验室的系统实现纳米空间分辨率.

结论:

  • 开发的仪器提供了一个可行的替代方案,以 synchrotron-based nanotomography.
  • SEM和TES的结合使得高分辨率,元素特定的成像成为可能.
  • 未来的工作可以提高高级材料分析的分辨率和成像能力.