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基于里埃转换的后处理漂移补偿和校准方法用于扫描探头显微镜

M Le Ster¹, S Pawłowski¹, I Lutsyk¹

¹University of Lodz, Faculty of Physics and Applied Informatics, Department of Solid-State Physics, Pomorska 149/153, Lodz, 90-236, Poland.

Ultramicroscopy

|May 14, 2024

概括

这项研究引入了一种新的方法来纠正扫描探针显微镜 (SPM) 中漂移引起的图像扭曲. 该技术使用格子参数来提高原子分辨率的SPM图像的准确性.

科学领域:

纳米规模的科学和技术.
表面科学是一门科学.
材料的表征材料的表征.

背景情况:

扫描探针显微镜 (SPM) 对于纳米尺度成像至关重要,提供安格斯特罗姆分辨率.
SPM图像容易漂移,导致扭曲,可以掩盖细节.
现有的操作式漂移补偿方法并不总是纠正所获得图像中的剩余线性漂移.

研究的目的:

介绍一种新的基于空间的相互技术,用于补偿SPM图像中的线性漂移.
解决在原子解析的SPM数据中常见的忽视纠正剩余线性漂移的问题.
提供一种不需要来自不同扫描方向的多个图像的方法.

主要方法:

对于漂移补偿,采用基于空间的互惠方法.
该方法利用对格子参数的先验知识进行校正.
它在不区分快速和慢速扫描方向的情况下运行.

主要成果:

本文所介绍的技术有效地弥补了SPM图像中的线性漂移.
它消除了对来自不同扫描方向的多个SPM图像集的需求.
该方法也可用于描述和校准SPM仪器.

结论:

该技术提供了一种有效的方法来纠正原子分辨率SPM图像中的线性漂移.
它通过不需要多个扫描方向来简化SPM数据的后处理.
该方法提高了SPM成像和仪器校准的可靠性和准确性.

关键词:

校准校准校准校准校准校准校准漂流补偿漂流补偿漂流补偿互惠的空间互惠的空间.扫描探针显微镜扫描探针显微镜

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