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对硫参考材料的36S完全分辨的高精度测量

Jiayang Sun¹, James Farquhar^1,2

¹Department of Geology, University of Maryland, College Park, Maryland, USA.

Rapid communications in mass spectrometry : RCM

|May 15, 2024

概括

使用高分辨率质谱仪来解决干扰,提高了精确的硫-36同位素 (³⁶S) 测量. 这种新方法克服了精确36S分析的挑战,这对地质化学研究至关重要.

科学领域:

地质化学地质化学
分析化学分析化学
同位素科学同位素科学

背景情况:

硫同位素测量技术已经进步,但准确的36S分析仍然很困难.
未解决的等离子干扰,如36+,186WF4+和12C3F5+,导致尺度压缩和36S值的低估.

研究的目的:

为测量四硫同位素 (S,S,S,S) 开发一种无干扰的方法.
为了解决由等离子干扰引起的精确36S分析的挑战.

主要方法:

使用高分辨率质谱仪Panorama进行硫同位素分析.
采用了Panorama的质量分辨能力来区分36SF5+和干扰离子,如186WF2+和12C3F5+等.
优化了仪器调和冲洗程序,以尽量减少干扰.

主要成果:

显著减少了186 WF 4 2+ 和 12 C 3 F 5+ 干扰 (分别从 9.4% 降至 1.5% 和 74% 至 40%).
分析了IAEA标准 (IAEA-S-1, -S-2, -S-3) 使用Panorama和MAT 253,获得了可比的δS值.
在Panorama和MAT 253之间观察到Δ³⁶S值的差异,突出显示未解决干扰的影响.

结论:

测量差异强调了来自等离体干扰的尺度压缩对36S分析的关键影响.
建议使用丝材料,调丝电压,并尽量减少碳在仪器中以减轻干扰.
建议对d³³S,d³⁴S和d³⁶S进行系统的校准,使用国际原子能机构的标准和括号测量进行准确的分析.

关键词:

在36S/32S上.异倍干扰的干扰是同等的全景高分辨率IRMS IRMS 的硫同位素的校准硫同位素的校准.

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