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Updated: Jun 26, 2025

Visualization of Low-Level Gamma Radiation Sources Using a Low-Cost, High-Sensitivity, Omnidirectional Compton Camera
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检测器内康普顿散射对低频DQE的影响,用于使用边缘辐射探测器进行光子计数CT

Fredrik Grönberg1,2, Zhye Yin3, Jonathan S Maltz4

  • 1Department of Physics, KTH Royal Institute of Technology, AlbaNova University Center, Stockholm, Sweden.

Medical physics
|May 16, 2024
PubMed
概括

探测器中的康普顿散射显著影响光子计数CT成像. 优化能量值有助于捕捉康普顿相互作用,提高密度和光谱成像性能.

关键词:
康普顿分散的散射器通过光子计数进行光子计数.用光子计数CTCT进行测试.探测器是一种探测器.一个X射线探测器.

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Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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