X-ray Crystallography
Determining the Plane of Cell Division
Plane Electromagnetic Waves I
Three-Dimensional Analysis of Strain
The Phragmoplast
Fault Types
您也可能阅读
通过共同作者、期刊和引用图与本文相关的文章。
Updated: Jun 26, 2025

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries
Published on: April 22, 2013
1Sandia National Laboratories, Albuquerque, New Mexico 87123, USA.
这项研究揭示了稳定,双相周期性谷物边界结构的条件. 弹性效应和材料特性是关键的,失位含量影响图案稳定性.
11:14Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
06:57Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
科学领域:
背景情况:
研究的目的:
主要方法:
主要成果:
结论: