相关实验视频

Updated: Jun 26, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

3.0K

原子力显微镜在单个纳米线的机械测量中

Bartosz C Pruchnik1, Janusz D Fidelus2, Ewelina Gacka1

  • 1Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland.

Ultramicroscopy
|May 17, 2024
PubMed
概括

本研究详细介绍了一种用于测量单一氧化 (ZnO) 纳米线 (NW) 机械性能的新方法. 这项技术揭示了Young的显著变化.

关键词:
航空飞行管理 (AFM)纳米操纵技术的使用纳米机械学 纳米机械学纳米电线纳米电线ZnO ZnO ZnO ZnO ZnO ZnO ZnO ZnO ZnO ZnO ZnO ZnO

更多相关视频

Measuring the Mechanical Properties of Living Cells Using Atomic Force Microscopy08:41

Measuring the Mechanical Properties of Living Cells Using Atomic Force Microscopy

Published on: June 27, 2013

40.1K
Quantitative Hardness Measurement by Instrumented AFM-indentation08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

9.6K

相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K