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Updated: Jun 17, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

第一个X射线光谱图解和共振图解计算机断层扫描实验在SYNCHROTRON SOLEIL的SWING光线上进行

Anico Kulow1, Javier Pérez2, Redhouane Boudjehem1

  • 1Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel, 25 Avenue des Martyrs, BP 166, 38042 Grenoble, France.

Journal of synchrotron radiation
|May 21, 2024
PubMed
概括

在SWING光线线上的先进X射线图解使材料属性的详细3D映射成为可能. 这种技术成功地识别了线中的杂质,展示了其对纳米分析的潜力.

关键词:
复杂的折射率指数是一个复杂的折射率指数.图解图X射线计算图解图.响应式图形学 (ptychography) 是一种共振图形学.频谱影像学 频谱影像学 频谱影像学

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