相关实验视频

Updated: Jun 25, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
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Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

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用于原子力显微镜的磁性-电流流杆.

Gala Sanchez-Seguame1, Hugo Avalos-Sanchez1, Jesus Eduardo Lugo1,2,3

  • 1Facultad de Ciencias Físico-Matemáticas, Benemérita Universidad Autónoma de Puebla, Av. San Claudio y Av. 18 sur, Col. San Manuel Ciudad Universitaria, Puebla Pue 72570, Mexico.

Nanomaterials (Basel, Switzerland)
|May 24, 2024
PubMed
概括

研究人员使用磁电电复合材料开发了用于原子力显微镜 (AFM) 的新型,具有成本效益的无尖. 这些探头为纳米级表面分析提供了更高的稳定性和精度,克服了传统探头的局限性.

关键词:
航空飞行管理 (AFM)可以使用CANtilevers.奥帕尔磁性复合材料的复合材料

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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