石墨/h-BN 范德瓦尔斯的异构结构作为HgTe量子井的门
Xianhu Liang1,2, Saquib Shamim1,2, Dongyun Chen1,2
1Physikalisches Institut (EP3), Universität Würzburg, 97074 Würzburg, Germany.
Nanotechnology
|May 24, 2024
概括
在HgTe设备上的六角化 (h-BN) /石墨门可以防止费米水平的变化,而不是HfO2门. 这一突破增强了对自旋电子和量子计算应用的拓绝缘体的控制.
科学领域:
- 凝聚物质物理学 凝聚物质物理学
- 材料科学 材料科学 材料科学
背景情况:
- 二维拓绝缘器对于自旋电子学和量子计算至关重要.
- 将费尔米水平调整到电场的大带间隙中,对于观察异国情调现象至关重要.
- 六角化 (h-BN) 提供了一个平坦的,无电荷的表面,非常适合门介电.
研究的目的:
- 为了研究h-BN/石墨范德瓦尔斯异构结构作为基于HgTe异构的Hall bar设备的顶端门.
- 为了比较h-BN/石墨门与传统的h-BN/Ti/Au和HfO2/Ti/Au门的性能.
- 解决关闭的HgTe异构结构中显著载体密度转移的问题.
主要方法:
- 基于HgTe异构的Hall bar设备的制造.
- 集成h-BN/石墨范德瓦尔斯异构结构作为顶端门.
- 与使用h-BN/Ti/Au和HfO2/Ti/Au门的设备进行比较.
- 对电荷载体密度和电子流动性的分析.
主要成果:
- 带有h-BN/石墨门的设备没有显示电荷载体密度的变化.
- HfO2/Ti/Au封闭器件显示了显著的n型载体密度增加.
- 与基于HfO2的设备相比,h-BN门式设备的电子移动性略高.
- 确定HgTe和石墨的工作功能是观察到的稳定性的关键因素.
结论:
- h-BN/石墨范德瓦尔斯异构结构是HgTe设备的有效顶端门,防止不必要的载体密度转移.
- 已经证明了分层材料转移与湿蚀结构的兼容性.
- 这种方法提供了一种可行的策略,用于精确控制封闭的拓绝缘装置中的载体密度.
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