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Updated: May 27, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
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基于PCB-DeepLabV3算法对芯片接接头的X射线图像中空缺陷的细分

Defeng Kong1,1, Xinyu Hu2,2, Ziang Gong1,1

  • 1School of Mechanical Engineering, Hubei University of Technology, Wuhan, China.

Scientific reports
|May 24, 2024
PubMed
概括

这项研究引入了改进的PCB-DeepLabV3算法,用于准确检测芯片接接头的空隙. 这种新方法增强了空隙细分,使智能检查和缺陷检测的准确性更高.

关键词:
人工智能的人工智能是人工智能.自动X射线检查自动化检查芯片接器缺陷 芯片接器缺陷图像处理 图像处理语义细分 语义细分是指语义细分.一个X射线发电机.

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Imperfections in Crystal Structure: Point, Line and Plane Defects01:25

Imperfections in Crystal Structure: Point, Line and Plane Defects

A perfect crystal, in theory, has a uniform structure with the same unit cell and lattice points throughout. However, any deviation from this periodic arrangement is known as an imperfection or defect. These defects can be categorized into three types: point, line, and plane defects.Point defects occur when there is a deviation from the ideal due to missing atoms, displaced atoms, or additional atoms. These imperfections might occur due to imperfect packing during crystallization or because of...