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基于X参数理论的集成电路的非线性行为水平导电免疫性的频域黑盒建模方法研究
Xi Chen1, Shuguo Xie1, Mengyuan Wei1
1School of Electronic and Information Engineering, Beihang University, Beijing 100191, China.
Micromachines
|May 25, 2024
概括
本研究介绍了Sensi-Freq-Model,这是一种用于集成电路 (IC) 传导灵敏性的新型频域方法. 这种方法显著减少了建模时间,并提高了宽带免疫性评估的准确性.
科学领域:
- 电气工程 电气工程
- 电磁兼容性 电磁兼容性 电磁兼容
- 半导体设备建模模型
背景情况:
- 传统的黑子模拟电路传导免疫,如时间域方法或ICIM-CI模型,由于广泛的测试要求,漫长的建模时间,以及频率域分析的准确性差,因此受到影响.
- 现有的方法难以捕捉复杂的电磁反应,缺乏可重复性,阻碍了高效的宽带免疫性评估.
研究的目的:
- 为集成电路 (IC) 传导易感性开发一种新的频域宽带模型,命名为Sensi-Freq-Model.
- 准确量化频域中的组件导电免疫性,并提高电路宽带设计的准确性.
主要方法:
- 提出了一种新的频域宽带模型 (Sensi-Freq-Model) 对于IC导电易感性.
- 在频域中量化传导免疫数据以构建IC模型.
- 专注于保留频域宽带信息,以提高模型可移植性和可重复性.
主要成果:
- 森西频率模型在频率领域表现出高匹配精度.
- 与传统的ICIM-CI方法相比,大约90%的宽带建模时间大大减少.
- 将正常化平均平方误差 (NMSE) 提高了18.5dB,表明精度提高.
结论:
- 森西频率模型提供了一种更有效,更准确的方法来评估IC导电易感性.
- 该模型通过减少在不同电磁环境下重新构建模型的需要来提高可移植性和可重复性.
- 这一进步显著提高了建模效率,并支持更准确的电路宽带设计.
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