:

Lei Li1, Xinyu Du1, Jibing Chen1

  • 1School of Mechanical Engineering, Wuhan Polytechnic University, Wuhan 430023, China.

概括

电子接接头的热疲劳会导致微观结构粗和裂的开始. 了解这些故障机制是提高温度周期下的电子产品可靠性的关键.