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Updated: Aug 8, 2026

Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography
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研究一种机器学习方法来预测晶圆中的白像素缺陷-晶圆制造工厂的案例研究 F

Dong-Her Shih1, Cheng-Yu Yang2, Ting-Wei Wu1

  • 1Department of Information Management, National Yunlin University of Science and Technology, Douliu 64002, Taiwan.

Sensors (Basel, Switzerland)
|May 25, 2024
PubMed
概括

本研究确定了导致CMOS图像传感器 (CIS) 中白色像素的关键研磨因素. 机器学习模型准确地预测这些缺陷,使制造商能够减少客户投诉并提高半导体质量.

关键词:
这是一个CMOS图像传感器.机器学习是机器学习.预测 预测 预测 预测晶圆片 晶圆片 晶圆片白色像素缺陷 在白色像素缺陷

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Imperfections in Crystal Structure: Point, Line and Plane Defects01:25

Imperfections in Crystal Structure: Point, Line and Plane Defects

A perfect crystal, in theory, has a uniform structure with the same unit cell and lattice points throughout. However, any deviation from this periodic arrangement is known as an imperfection or defect. These defects can be categorized into three types: point, line, and plane defects.Point defects occur when there is a deviation from the ideal due to missing atoms, displaced atoms, or additional atoms. These imperfections might occur due to imperfect packing during crystallization or because of...