患有围叶的切除手术的患者的术后神经结果:系统性审查
Stuart Gates1, Dawn E Hackman1, Nitin Agarwal1
1From the University of Minnesota Medical School (S.G.), Minneapolis, MN; Dr. Martin Luther King, Jr. Library (D.E.H.), San José State University, San José, CA; Pediatric Epileptology (N.A.), Minnesota Epilepsy Group, Roseville; Pediatric Epileptology (N.A.), Children's Minnesota, Minneapolis; Neurology (W.Z., J.R.W.), Minnesota Epilepsy Group, Roseville; Neurology (W.Z.), United Hospital of Allina Health, St. Paul; Allina Health (P.B.); Center for Orphan Drug Research (J.R.W.), University of Minnesota; and Epileptology (J.R.W.), Abbott Northwestern Hospital, Minneapolis, MN.
围叶手术可以在27%的患者中引起新的神经学缺陷,其中运动缺陷是最常见的. 这些赤字中的许多都是暂时的,随着时间的推移而改善.
科学领域:
- 神经外科 神经外科
- 发病学 (Epileptology) 是一个专业的学科.
- 神经学 神经学
背景情况:
- 围叶 (PLE) 手术为难治性提供了一个治疗选择.
- 然而,PLE切除手术存在新的术后神经学缺陷的风险.
结论:
- PLE手术与短暂和长期神经系统缺陷的显著率有关,包括运动障碍.
- 文献中有缺陷,需要进一步研究和明确的报告标准.
- 本综述提供了全面的总结,并突出了未来调查的领域.
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