X线

Jingyu Li1, Qingsong Hu2, Jiawen Xiao1

  • 1Beijing Key Lab of Microstructure and Property of Advanced Materials, College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China.

概括

这项研究引入了一种稳定的二维分层双矿,Cs4Cd1-xMnxBi2Cl12,用于X射线成像. 该材料具有出色的稳定性,高光输出率,在灵活的X射线成像应用中具有卓越的性能.