全头头皮下脑电图的可行性,安全性和性能,使用最少的侵入性电极植入

Ellen van Maren¹, Sigurd L Alnes¹, Janir Ramos da Cruz¹+16

• ¹From the NeuroTec (E.v.M., S.L.A., C.F.-M., K.W., S.F., M.F., A.T., K.S., M.O.B.), Center for Sleep-Wake-Epilepsy, Center for Experimental Neurology, Department of Neurology, Inselspital Bern, University Hospital, and Institute of Computer Science (S.L.A., A.T.), University of Bern; Wyss Center for Bio and Neuroengineering (J.R.d.C., A.S., I.V., J.Z., T.B., G.K.), Geneva; Department of Neurosurgery (S.L.B., W.J.Z.G., C.P.), Inselspital Bern, University Hospital, University of Bern, Switzerland; and Department of Neuroscience (J.D.), Brown University, Providence, RI.