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Christo Guguschev1, Christian Hirschle2, Kaspars Dadzis1

  • 1Leibniz-Institut für Kristallzüchtung, Max-Born-Strasse 2, 12489 Berlin, Germany.

Journal of applied crystallography
|June 7, 2024
PubMed
概括

高分辨率的X射线光映射现在可以通过测量布拉格峰强度波动来检测单晶中的位移. 这种技术提供了与传统方法相似的结果,有助于晶体生长研究.

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