X线

Chen Shen1, Honghu Zhang2, Benjamin M Ocko2

  • 1Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Journal of applied crystallography
|June 7, 2024
PubMed
概括

这项研究引入了一种更快的方法,用于测量液体表面的X射线反射率 (XRR),使用牧场发射率X射线非光谱散射 (GIXOS) 数据. 这种名为伪XRR的新技术准确地导出了反射性概况,从而在表面科学中实现了更广泛的应用.

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