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Johannes Dallmann1, Jonas Graetz1, Rainer Hock1
1Institute for Crystallography and Structural Physics, Friedrich-Alexander-Universität, Erlangen-Nürnberg, Germany.
这项研究引入了一种射线追踪算法,用于准确的X射线粉末衍射吸收校正. 该方法模拟复杂的样本,改善对非理想材料的数据分析.
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11:48Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
06:49In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
Published on: March 2, 2021
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