X 线.

Štefan T Stanko1, Jürgen E K Schawe1,2, Florian Spieckermann3

  • 1Laboratory of Metal Physics and Technology, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland.

概括

这项研究表明,X射线束可以在同时进行快速微分扫描热度计 (FDSC) 和X射线测量时损害样品. 了解光束引起的加热和损伤对于准确的材料表征至关重要.

相关概念视频

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