Updated: Jun 24, 2025
Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Shuying Chen, Hanyu Fu, Chengwen Yang+3
一种新的分析圆测量方法 (AEM) 在环境条件下测量反应光学材料的介电函数. 这克服了传统方法对膜等敏感材料的局限性.
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