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Updated: Jun 24, 2025

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同时测量表面速度和等离子体密度,使用干扰测速速度计

Nathan P Brown¹, Christopher A Jennings¹, Christopher De La Cruz¹

¹Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1189, USA.

The Review of scientific instruments

|June 13, 2024

概括

本研究同时使用联合VISAR和PDV技术测量高速表面和等离子体密度. 表面速度可以准确地确定,即使不知道等离子体密度概况.

科学领域:

等离子体物理学的物理学
光学计量学在光学计量学

背景情况:

介面测速仪测量表面速度和折射率变化.
同时测量等离子体密度和表面速度是具有挑战性的.

研究的目的:

为了同时测量km/s表面速度和等离子体密度.
开发一种独立于等离子体密度配置文件的表面速度提取方法.

主要方法:

使用任何反射器 (VISAR) 和光子多普勒测速仪 (PDV) 测量的联合速度干扰仪系统.
在Z脉冲发电设施上进行实验.
开发了分析技术,以考虑到双重敏感性.

主要成果:

成功测量了每公里/秒的表面速度和平均等离子体密度为10^18 cm^-3.
证明可以提取表面速度,而无需先前了解等离子体密度概况.
验证了管理方程和分析假设.

结论:

结合VISAR和PDV,为诊断高能量密度等离子体提供了一个强大的工具.
开发的方法允许在动态等离子体环境中准确地测量表面速度.
这种技术有助于更好地理解极端条件下的物质行为.

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