GaAs (001) GeSn线,Epitaxy

Calbi Gunder1, Mohammad Zamani-Alavijeh2, Emmanuel Wangila1

  • 1Materials Science and Engineering, University of Arkansas, Fayetteville, AR 72701, USA.

概括

这项研究引入了一种新的对数算法,用于精确控制分子束表达过程中的-锡 (GeSn) 薄膜组成. 该算法可以在化基板上生长高质量的,线性分级的GeSn薄膜,其锡含量高达16%.