使用高光谱成像技术对近红外染料颜色的织物进行表征
Rajbir Kaur1, Muhammad Mudassir Arif Chaudhry1, Catherine Findlay1
1Department of Biosystems Engineering, University of Manitoba, Winnipeg, MB, R3 T 5V6, Canada.
Applied spectroscopy
|June 17, 2024
概括
近红外 (NIR) 染料在棉布上使用高光谱成像进行分析. 可见NIR (Vis-NIR) 成像成功地区分了染料度,这对于有效的伪装织品至关重要.
科学领域:
- 织科学和材料工程 织科学和材料工程
- 光谱学和光学特征的描述.
- 军事应用和国防技术
背景情况:
- 近红外 (NIR) 染料对于伪装应用至关重要,因为它们具有光相互作用特性.
- 织物染色参数如度和温度显著影响颜色和性,影响伪装的有效性.
- 超光谱成像为染色织品的特征提供了一种非破坏性的方法.
研究的目的:
- 使用可见NIR (Vis-NIR) 和短波红外 (SWIR) 超光谱成像,用NIR吸收染料染色的棉织物的特征.
- 辨别与染料度和染色温度相关的光谱变化.
- 评估光谱分析在确保一致的伪装性能方面的潜力.
主要方法:
- 棉织物在不同的NIR染料度 (2.5%, 5%, 10%) 和温度 (55°C, 85°C) 染色.
- 可见NIR (Vis-NIR) 和短波红外 (SWIR) 超光谱成像被用于光谱数据采集.
- 主要组件分析 (PCA) 和部分最小平方差异分析 (PLS-DA) 用于光谱数据分析和分类.
主要成果:
- 基于染料度和染色温度,PCA模型有效地区分了织物.
- 在Vis-NIR范围内,PLS-DA模型实现了高分类精度 (75-100%) 以区分染料度.
- SWIR光谱数据没有显示NIR染料度的差异,这表明隐形应用的潜力.
结论:
- 可见NIR高光谱成像是一种可行的方法,用于控制NIR染色伪装面料的质量.
- 无法检测SWIR中的度差异符合在不同条件下创建无法区分的伪装的目标.
- 通过确保一致的NIR光谱特性,这些发现支持为军事应用开发先进的隐形织品.
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