一个用于量子技术的自参照光学相位噪声分析仪
R Freund1, Ch D Marciniak1, T Monz1
1Universität Innsbruck, Institut für Experimentalphysik, Innsbruck, Austria.
The Review of scientific instruments
|June 20, 2024
概括
我们为量子技术开发了一种低成本的光学相位噪声分析仪. 该工具准确地测量相位噪声,为昂贵的商业选择提供了具有成本效益的替代方案,用于描述量子系统.
科学领域:
- 量子技术 量子技术是一种量子技术.
- 光学计量学 在光学计量学
背景情况:
- 量子技术需要精确控制噪声,以实现量子优势.
- 描述噪声,特别是相位噪声功率光谱密度,至关重要,但对于领先的量子平台来说,这往往是技术上苛刻和昂贵的.
研究的目的:
- 介绍和描述一个低复杂性,低成本的光学相位噪声分析仪.
- 为了使量子技术应用中可访问的相位噪声测量.
主要方法:
- 使用了短延迟的光学自异极测量.
- 为光学相位噪声分析仪实施了全库存组件设计.
- 我们比较了两个超稳定的振荡器,它们的线宽为1Hz,距离729nm附近.
主要成果:
- 实现了与商业产品相美的低噪音.
- 证明了设备测量相位噪声功率光谱的能力.
- 识别了实施的测量设备的限制和权衡.
结论:
- 开发的光学相位噪声分析仪为量子技术开发提供了具有成本效益和可访问性的解决方案.
- 这种设置可以成为组件制造商的宝贵传感器,即使没有高度稳定的参考或操作量子系统.
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