:

Sonam Zangpo Bhutia1,2, Sathish K Sukumaran3, Dillip K Satapathy1,2

  • 1Soft Materials Laboratory, Department of Physics, IIT Madras, Chennai 600036, India.

概括

这项研究引入了一种新方法,用于使用光谱圆测量来准确测量超薄聚合物薄膜的厚度和光学异构性. 该方法解决了光学建模中的参数相关性所带来的挑战.

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