线线

Peng Zhang1

  • 1School of Electrical Engineering, Tongling University, Tongling, China.

Journal of microscopy
|June 26, 2024
PubMed
概括

样本温度在扫描电子显微镜 (SEM) 中显著影响线扫描配置文件. 更高的温度增强了形状肩膀,改变了二次和反向散射电子的对比度,为纳米结构温度测量提供了洞察力.