一个新型的高速分割门沟载体存储的沟门双极晶体管,具有增强的短路度
Zhehong Qian1, Wenrong Cui1, Tianyang Feng1
1School of Microelectronics, Fudan University, Shanghai 200433, China.
Micromachines
|June 27, 2024
概括
这项研究引入了一种具有分门技术的新型载波存储沟门双极晶体管 (CSTBT),显著改善动态特性和短路性能. 新设计增强了故障电压,并减少了先进功率电子产品的功率损失.
科学领域:
- 半导体设备物理 半导体设备物理
- 电力电子 电力电子 电力电子
背景情况:
- 载波存储的沟双极晶体管 (CSTBT) 对于高效电源切换至关重要.
- 现有的CSTBT面临着门采集器电容和短路稳定性的挑战.
研究的目的:
- 提出一种新的CSTBT,采用分门技术,以增强动态特性和短路保护.
- 调查设备设计修改对故障电压和功率损失的影响.
主要方法:
- 设计了一种新的CSTBT结构,在沟中设置了一个分裂的多电极.
- 使用离子植入和化来形成特定的兴奋剂层 (P层,载体储存 (CS) 层,P体).
- 模拟了设备性能,并与传统的CSTBTs进行了比较.
主要成果:
- 降低了门采集器电容 (CGC),从而改善了动态特性.
- 由于沟下方的P层,增加了故障电压 (BV).
- 关机时间 (38.4%) 和关机损失 (41.8%) 显著减少.
- 短路电流减少了50%,短路时间增加了2.46倍.
结论:
- 与传统设计相比,拟议的分裂门CSTBT提供了卓越的动态性能和增强的短路保护.
- 该设备的设计有效地减轻了阳极冲击,并改善了孔积累.
- 这项技术为高速,可靠的电源开关应用提供了有前途的进步.
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