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Updated: May 10, 2026

Synthesis and Operation of Fluorescent-core Microcavities for Refractometric Sensing
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基于高Q不对称V形CaF2共振器的高灵敏力传感器

Deyong Wang1, Jiamin Rong2, Jianglong Li1

  • 1Key Laboratory of Dynamic Testing Technology, School of Instrument and Electronics, North University of China, Taiyuan 030051, China.

Micromachines
|June 27, 2024
PubMed
概括

这项研究引入了一种使用高质量因子 (高-Q) 非对称V形化 (CaF2) 振荡器的新型力感应系统. 这种低语画廊模式 (WGM) 共振器实现了高灵敏度的精确力测量.

关键词:
在WGM共振器的共振器.不对称的V字形形状.强力传感器是一种强力传感器.

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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