一个带有SIPOS支柱的新型IGBT在TCAD模拟研究中实现了超低功耗损失
Song Yuan1,2, Zhaoheng Yan1,2, Yanzuo Li1,2
1The Key Laboratory of Ministry of Education for Wide Bandgap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi'an 710071, China.
Micromachines
|June 27, 2024
概括
与Field-Stop IGBT相比,一个新的半绝缘多聚 (SIPOS) 绝缘门双极晶体管 (IGBT) 减少了58%的开关损失. 这种新型设备为功率电子应用提供了改进的导电和切换性能.
科学领域:
- 电力电子 电力电子 电力电子
- 半导体设备 半导体设备
- 材料科学 材料科学 材料科学
背景情况:
- 传统的绝缘门双极晶体管 (IGBT) 在平衡导电和切换损失方面面临着挑战.
- 优化电场分布和载体度对于提高IGBT性能至关重要.
研究的目的:
- 介绍和分析一个新的半绝缘聚 (SIPOS) IGBT.
- 评估SIPOS-IGBT的性能改进,特别是在切换损失和状态特征方面.
主要方法:
- 技术计算机辅助设计 (TCAD) 模拟用于设备分析.
- 将SIPOS-IGBT与已建立的Field-Stop (FS) IGBT和HK-IGBT结构进行比较.
主要成果:
- SIPOS-IGBT在离子状态中表现出均的电场分布,允许更薄的漂移区域.
- 在启动状态中的电子积累层增强了载体注入和度.
- 由于快速漂移地区枯竭,观察到明显减少的转机损失.
- 模拟结果显示,关机损耗比FS-IGBT低58%,比HK-IGBT低30%.
结论:
- SIPOS-IGBT有效地改善了传导和开关损耗之间的权衡.
- 这种新的设备架构为高效电源切换应用提供了卓越的性能.
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