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Updated: Jun 22, 2025

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
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走向一个集成的多千兆赫兹电离粒子诊断系统.

J Bohon1, C Grace1, M Gulley2

  • 1Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.

The Review of scientific instruments
|June 27, 2024
PubMed
概括

研究人员正在开发用于加速器设施的钻石传感器的辐射硬化,多千兆赫兹 (GHz) 粒子检测系统. 这项技术旨在精确追踪高重复率的粒子束,改善加速器和等离子体物理的诊断.

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