Chi Shing Tsang1, Xiaodong Zheng2, Thuc Hue Ly3

  • 1Department of Applied Physics, The Hong Kong Polytechnic University, Kowloon, Hong Kong, China; Department of Chemistry and Center of Super-Diamond & Advanced Films (COSDAF), City University of Hong Kong, Kowloon, Hong Kong, China.

Micron (Oxford, England : 1993)
|June 28, 2024
PubMed
概括

先进的传输电子显微镜 (TEM) 可视化了二维材料中的原子级铁电领域. 这种技术揭示了结构-属性关系,在微型电子和能源设备中推进了应用.