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Updated: May 3, 2026

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非常大规模的集成高质量因素纳米天线像素非常大规模的纳米天线像素.

Varun Dolia1, Halleh B Balch2, Sahil Dagli2

  • 1Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA. vdolia@stanford.edu.

Nature nanotechnology
|July 3, 2024
PubMed
概括

研究人员开发了纳米天线像素 (VINPix),可以同时实现高质量因素,亚波长模式体积和受控光辐射. 这一突破克服了传统的权衡,使紧和密集的多重光学设备成为可能.

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相关概念视频

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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