相关实验视频

Updated: Jun 21, 2025

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
10:15

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

14.8K

探索表面电荷动态:对2D材料中的AFM高度测量的影响

Mario Navarro-Rodriguez1, Andres M Somoza1, Elisa Palacios-Lidon1

  • 1Centro de Investigación en Óptica y Nanofísica (CIOyN), Department of Physics, University of Murcia, E-30100, Spain.

Beilstein journal of nanotechnology
|July 9, 2024
PubMed
概括

一个由电荷动力学驱动的新尔散射机制,影响了2D材料的原子力显微镜测量. 这一发现对于理解二维材料的表面导电性至关重要,影响成像中的高度精度.

关键词:
两维材料是二维材料.焦力散发的焦力散发是什么错误的高度测量测量是错误的表面导电性 表面导电性影响 影响 影响 影响 影响 影响

更多相关视频

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Published on: February 10, 2021

6.9K
Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy10:37

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

9.6K

相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K