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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Jun 21, 2025

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

Published on: November 16, 2019

增强的定量波面成像用于纳米物体的表征.

Clémence Gentner¹, Benoit Rogez^1,2, Hadrien M L Robert¹

¹Institut de la Vision, Sorbonne Université, CNRS-UMR 7210, Inserm-UMR S968, Paris 75012, France.

|July 9, 2024

概括

此摘要是机器生成的。

这项研究增强了用于纳米物体表征的定量相位成像. 一种新的里埃平面方法显著提高了相位灵敏度,使得能够精确地测量质量和极化度.

关键词:

纳米颗粒是一种纳米粒子.定量阶段成像成像技术的使用.分散的对比度是分散的.增加灵敏度增加灵敏度单个纳米物体计量学

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科学领域:

光学物理学的光学物理.
纳米技术纳米技术
计量学计量学计量学

背景情况:

定量相成像 (QPI) 提供了无标签的纳米物体特征.
目前的共同路径QPI缺乏足够的相位灵敏度,用于精确的纳米粒子,病毒和囊泡的单次测量.
现有的方法难以准确地估计质量和极化能力.

研究的目的:

适应Zernike过用于波面成像,以提高QPI中的相位灵敏度.
开发一种精确的纳米物体检测和计量方法.
改进强度和相位信息的定量检索.

主要方法:

对于波成像应用的Zernike过原理的重新审视.
在现有的波面传感设置中实现富里埃平面附加.
使用高分辨率波面传感进行数值模拟和实验验证.

主要成果:

对于亚衍射物体的相位灵敏度,达到一个数量级的增加 (×12).
与现有的共同路径实现相比,相传感度显著提升.
能够对纳米物体进行强度和相位信息的定量检索.

结论:

拟议的福里埃平面补充显著提高了QPI中的相位灵敏度.
这一进步使得更精确的纳米物体检测和计量学成为可能.
该方法可以适应各种纳米物体,如囊泡,病毒和纳米粒子.