X线

Filip Hládek1,2, David Zůza1,2, Ondřej Navrátil1,2

  • 1Department of Chemical Engineering, University of Chemistry and Technology, Prague, Technická 5, Praha 166 28, Czech Republic.

PubMed
概括

这项研究引入了一种新的方法,使用X射线微图学来追踪单个粒子溶解,揭示了超出传统内在溶解率 (IDR) 测量的变化.