MINFLUX

Carlas Smith1, Dylan Kalisvaart1, Kirti Prakash2

  • 1Department of Mechanical Engineering, Delft Center for Systems and Control, Technische Universiteit Delft, Delft, Zuid-Holland, the Netherlands.

Journal of microscopy
|July 10, 2024
PubMed
概括

提高单分子定位精度至关重要. 我们的代显微镜方法使用先前的信息来提高准确性和减少光子要求,优化分子成像.