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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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相关实验视频

Updated: Jun 21, 2025

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

Published on: December 3, 2013

快速的三维造型测量,具有很大的深度.

Wei Zhang¹, Jiongguang Zhu², Yu Han¹

¹Department of Computer Technology and Science, Anhui University of Finance and Economics, Bengbu 233030, China.

Sensors (Basel, Switzerland)

|July 13, 2024

概括

一种新的时域高斯拟合方法使用神经网络增强了3D成像速度和深度 (DoF). 这种技术为复杂的表面提供了快速,准确的3D形状测量,并缩短了计算时间.

关键词:

现场深度很大,具有很大的深度.神经网络的神经网络的神经网络三维个人资料测量三维个人资料测量时间域高斯适配

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Automated 3D Optical Coherence Tomography to Elucidate Biofilm Morphogenesis Over Large Spatial Scales

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Last Updated: Jun 21, 2025

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科学领域:

光学工程是指光学工程.
计算成像技术的成像
计算机视觉计算机视觉

背景情况:

二进制失焦技术加速3D成像,但受限于视野深度 (DoF) 和对失焦变化的敏感性.
现有的3D形状测量方法难以处理复杂的表面,需要大量的计算时间.

研究的目的:

开发一种快速而强大的3D成像技术,具有扩展的视野深度 (DoF).
解决现有的二进制失焦方法在灵敏度和DoF方面存在的局限性.
为了实现复杂表面的精确3D测量.

主要方法:

提出了一种新的时间域高斯拟合方法,引入了时间域高斯曲线的概念.
神经网络技术用于快速计算时间域高斯曲线峰值位置.
二进制失焦技术与神经网络集成,用于增强的3D形状测量.

主要成果:

拟议的方法将系统的视场深度 (DoF) 扩大了五倍.
数据采集和计算时间都减少到不到35毫秒.
该方法表明,由于像素级特征提取,它适合测量复杂的表面.

结论:

二进制失焦和基于神经网络的时间域高斯调整的组合实现了快速的3D形状测量,具有很大的DoF.
拟议的技术在速度,DoF和对复杂表面的适用性方面提供了显著的改进.
这种方法代表了高速,大DoF 3D成像的实质性进步.