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Updated: May 4, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

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无双基矿X射线探测器具有高灵敏度和低检测极限

Zihao Zhao1,2, Qingshun Fan2, Yi Liu2

  • 1University of Chinese Academy of Sciences, Beijing 100049, China.

ACS applied materials & interfaces
|July 16, 2024
PubMed
概括

研究人员开发了一种新的基化基矿,用于X射线检测. 这种无材料 (HIS) BiI5具有高灵敏度和低检测极限,克服了X射线检测器技术的关键挑战.

关键词:
0D 基于比斯的矿石一个X射线探测器.一个厘米大小的单晶晶体.在这种情况下,它会产生键.低检测极限的低检测极限

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The limit of detection (LOD) is the smallest amount of analyte that can be distinguished from the background noise. The LOD value corresponds to the concentration at which the analyte signal is three times larger than the standard deviation of the blank signal. Below this value, the analyte signal cannot be differentiated from the background noise. It is calculated by dividing the calibration slope by 3 times the standard deviation of the blank signals.
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