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使用EELS校准TEM标本的低温温度

Abinash Kumar¹, Elizaveta Tiukalova¹, Kartik Venkatraman¹

¹Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA.

Ultramicroscopy

|July 21, 2024

概括

低温电子显微镜的精确温度校准对于在低温下研究材料至关重要. 本研究介绍了一种简单的电子能量损失光谱法,使用等离子体来准确测量局部样本温度.

科学领域:

材料科学材料科学材料科学
物理物理学物理
分析化学分析化学

背景情况:

低温扫描/传输电子显微镜 (Cryo-STEM/TEM) 对于在低温下成像敏感的生物样本和研究材料至关重要.
精确的局部温度校准对于理解量子材料中的相位过渡和新兴性质至关重要,但仍然是一个挑战.
现有的方法在不同的实验设置中可能缺乏精度或多功能性.

研究的目的:

在电子显微镜中开发和演示一种可靠的方法,用于精确地对低温冷却的样本进行局部温度校准.
为了应对在低温下准确测量温度的挑战,这对材料科学研究至关重要.
为了验证该方法在各种电子显微镜和冷却支架上的适用性.

主要方法:

使用电子能量损失光谱 (EELS) 来测量局部样本温度.
分析了EEL光谱中的散热等离子峰值的温度依赖转移,将转移与热膨胀/收缩相关联.
应用了该方法在单色和非单色电子束显微镜中校准不同的液冷却支架.

主要成果:

成功展示了一种基于EELS的简单多功能温度校准方法.
确定了设定点和实际样本温度之间的温度差异,范围从室温到100 K.
验证了该方法在各种低温持有器和电子显微镜配置中的有效性.

结论:

开发的EELS方法提供了一种强大而简单的方法,用于精确地校准冷样本的局部温度.
精确的温度校准,特别是在中间冷温度下,对于可靠的材料表征至关重要.
这种技术提高了电子显微镜中低温研究的精度和可靠性.

关键词:

低温电子显微镜的低温电子显微镜.电子能量损失光谱学电子能量损失光谱学局部温度测定地方温度测定容量等离子体转移的体积

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