相关实验视频

Updated: Jun 20, 2025

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

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实施低温光谱仪用于JET高分辨率的森散射诊断,用于中断等离子体测量

Z Huang1, D Kos1, M Maslov1

  • 1United Kingdom Atomic Energy Authority, Culham Campus, Abingdon, Oxon OX14 3DB, United Kingdom.

The Review of scientific instruments
|July 22, 2024
PubMed
概括

这项研究升级了高分辨率森散射诊断仪,用于在碎片注射实验期间在热灭之前和之后测量低温等离子体. 这一进步有助于理解等离子体物理和干扰.

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Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron09:41

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron

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