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Updated: Jun 20, 2025

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
08:10

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Published on: February 5, 2017

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异调高波静电力显微镜,具有改进的空间分辨率,用于纳米尺度识别金属/半导体碳纳米管

Kunqi Xu1,2, Yufeng Xie1,2, Saiqun Ma1,2

  • 1Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240, China.

ACS applied materials & interfaces
|July 23, 2024
PubMed
概括

一种新的异质高电静力显微镜 (HH-EFM) 方法改善了碳纳米管 (CNT) 的纳米尺度成像. 这种技术增强了空间分辨率,用于区分金属和半导体CNT并评估它们的电特性.

关键词:
原子力显微镜的原子力显微镜.碳纳米管的使用方法这是一个异质的异质.高电静力显微镜高电静力显微镜的空间分辨率.

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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