一个基于IGBT模块中的热流分布的交叉点温度模型,具有层空隙
Qi Li1, Feng Zhang1, Yonghe Chen1
1Guangxi Key Laboratory of Precision Navigation Technology and Application, Guilin University of Electronic Technology, Guilin, 541004, China.
Heliyon
|July 23, 2024
概括
层中的空隙显著影响绝缘门双极晶体管 (IGBT) 的热可靠性. 这项研究引入了一种新模型,可以准确预测结点温度,并监测空隙引起的水平温度差异.
科学领域:
- 电气工程 电气工程
- 材料科学 材料科学 材料科学
- 半导体设备 半导体设备
背景情况:
- 在绝缘门双极晶体管 (IGBT) 中的接空隙降低了热可靠性.
- 了解空隙引起的热流干扰对于设备性能至关重要.
研究的目的:
- 调查空隙大小和分数对热流,结点温度和热阻的影响.
- 开发一个改进的交叉点温度模型,以计算空气诱导的热流分布.
主要方法:
- 建立了一个改进的结点温度模型,包括热流分布 (HD) 和空隙特征.
- 引入了水平热阻和水平热容量,以模拟空隙效应.
- 为新模型提出了一个参数提取方法.
主要成果:
- 由于空气的高热阻,空隙阻碍了热流,导致热量水平传播.
- 模块表面温度差与空隙分数增加,从9.591°C上升到109.86°C,空隙分数从0%增加到40%.
- 拟议的模型准确地估计了结点温度,并监测了水平温度差异.
结论:
- 开发的模型为IGBT连接点温度估计提供了比传统的Cauer模型更高的准确性.
- 该模型精确监测芯片层内的水平温度差异,这对于热管理至关重要.
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