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Guangzheng Chen1, Kai Fan1, Runda Niu1

  • 1Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.

概括

这项研究引入了一种新的2D校准方法,以纠正由传感器脚微变形引起的纳米定位器错误. 该技术显著减少了交叉通话,并提高了定位准确度,以提高性能.